Authors
Calogero Sciascia, Nicola Martino, Torben Schuettfort, Benjamin Watts, Giulia Grancini, Maria Rosa Antognazza, Margherita Zavelani-Rossi, Christopher R McNeill, Mario Caironi
Publication date
2011/11/16
Journal
Advanced Materials
Volume
23
Issue
43
Pages
5086-5090
Publisher
Wiley-VCH Verlag GmbH & Co. KGaA
Description
Electro-optical mapping of the charge density with sub-micrometer resolution can be obtained in a high mobility, top-gate n-channel polymer field-effect transistor by charge modulation microscopy. Local features on the 1 μm scale are unveiled and, using scanning transmission X-ray microscopy measurements, are attributed to structural variations within the polymeric film.
Scholar articles
C Sciascia, N Martino, T Schuettfort, B Watts… - Advanced Materials, 2011